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C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Q
Insulation Resistance
Dielectric Strength
Appearance
NP0 Specification Limits
-55oC to +125oC
Within specified tolerance
<30 pF: Q≥ 400+20 x Cap Value
≥30 pF: Q≥ 1000
100,000MΩ or 1000MΩ - μF,
whichever is less
No breakdown or visual defects
No defects
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
1.0 kHz ± 10% for cap > 1000 pF
Voltage: 1.0Vrms ± .2V
Charge device with rated voltage for
60 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Deflection: 2mm
Resistance to
Flexure
Stresses
Capacitance
Variation
Q
±5% or ±.5 pF, whichever is greater
Meets Initial Values (As Above)
Test Time: 30 seconds
1mm/sec
Insulation
Resistance
Solderability
Appearance
Capacitance
Variation
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±2.5% or ±.25 pF, whichever is greater
90 mm
Dip device in eutectic solder at 230 ± 5oC
for 5.0 ± 0.5 seconds
Dip device in eutectic solder at 260oC for 60
Resistance to
Solder Heat
Q
Insulation
Resistance
Dielectric
Strength
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Appearance
Capacitance
Variation
No visual defects
≤ ±2.5% or ±.25 pF, whichever is greater
Step 1: -55oC ± 2o
Step 2: Room Temp
30 ± 3 minutes
≤ 3 minutes
Thermal
Shock
Q
Insulation
Resistance
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +125oC ± 2o
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
Dielectric
Strength
Appearance
Capacitance
Variation
Meets Initial Values (As Above)
No visual defects
≤ ±3.0% or ± .3 pF, whichever is greater
Repeat for 5 cycles and measure after
24 hours at room temperature
Charge device with twice rated voltage in
Load Life
Q
(C=Nominal Cap)
≥ 30 pF:
≥10 pF, <30 pF:
<10 pF:
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
test chamber set at 125oC ± 2oC
for 1000 hours (+48, -0).
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±5.0% or ± .5 pF, whichever is greater
Remove from test chamber and stabilize at
room temperature for 24 hours
before measuring.
Store in a test chamber set at 85oC ± 2oC/
≥ 30 pF:
Q≥ 350
85% ± 5% relative humidity for 1000 hours
Load
Humidity
Q
≥10 pF, <30 pF:
<10 pF:
Q≥ 275 +5C/2
Q≥ 200 +10C
(+48, -0) with rated voltage applied.
Insulation
Resistance
Dielectric
Strength
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Remove from chamber and stabilize at
room temperature for 24 ± 2 hours
before measuring.
5
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